Providing the complete solution for advanced
Burn-In and Reliability testing needs
High performance test chambers
High speed dynamic stimulation
MIDAS™ (Microprocessor Data Acquisition System) control & monitoring
system
Logic & mixed signal
device testing capability
Easily configured systems providing many options
of temperature, power and signal zones
Up to 12 power zones and 48 signal zones per system
The MIDAS™ 4500
Series Burn-In Reliability systems provide semiconductor
manufacturers with the facilities
to cover a wide range of device testing applications.
Deep sub-micron technologies down
to 0.13μ CMOS as well as high voltage BiCMOS technologies
are accommodated. High power consumption and high power
signal switching, which are needed for
the automotive market, are no longer a problem.
Also it is possible to use high-speed
low voltage digital signals as required by the telecom
and audio consumer market with long signal pattern
depths.
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MIDAS™ 4500 Series Dynamic Burn-In Test System for Advanced
Logic and Mixed Signal Testing Application
Flexitray
5000 Multi Temperature Zone Reliability Test System
Reltech
3000 High Volume Burn-in Test System with unique front
loading lattice for multi device type batch applications
High
Density System of Burn-In Hardware - designed for maximum
flexibility of device type and Burn-In configuration
Brochure
- Providing the complete solution for Advanced Semiconductor
Burn-In and Reliability testing needs
See Application
pages for Independent 19
month evaluation of Reltech Semiconductor test Equipment
conducted By S.E.A. in conjunction with AMI Semiconductor
and Philips Semiconductors.
The MIDAS
